6n138,6n139 2007-10-01 1 toshiba photocoupler gaa ? a s ired & photo ic 6n138, 6n139 current loop driver. low input current line receiver. cmos logic interface. the toshiba 6n138 and 6n139 consists of a gaa ? as infrared emitting diode coupled with a split - darlington output configuration. a high speed gaa ? as ired manufactured with an unique lpe junction, has the virtue of fast rise and fall time at low drive current. ? isolation voltage: 2500vrms (min.) ? current transfer ratio : 6n138 ? 300% (min.) (i f =1.6ma) : 6n139 ? 400% (min.) (i f =0.5ma) ? switching time: 6n138 ? t phl =10 s (max.) ? t plh =35 s (max.) 6n139 ? t phl =1 s (max.) ? t plh =7 s (max.) ? ul recognized: ul1577, file no. e67349 unit in mm toshiba 11 ? 10c4 weight: 0.54 g (typ.) pin configuration (top view) 1 : n.c. 2 : anode 3 : cathode 4 : n.c. 5 : gnd 6 : output 7 : output base 8 : v cc 1 4 3 2 8 7 6 5 schematic 8 v cc v o 7 gnd i cc i b i o + i f v f 2 3 6 5 v b -
6n138,6n139 2007-10-01 2 absolute maximum ratings ( * ) (ta = 0c to + 70c) characteristic symbol rating unit forward current (note 1) i f 20 ma pulse forward current i fp (*1) 40 ma total pulse forward current i fp (*2) 1 a reverse voltage v r 5 v led diode power dissipation (note 2) p d 35 mw output current (note 3) i o 60 ma emitter ? base reverse voltage v eb 0.5 v supply voltage v cc (*3) ?0.5 to 18 v output voltage v o (*3) ?0.5 to 18 v detector output power dissipation (note 4) p o 100 mw operating temperature range t opr 0 to 70 c storage temperature range t stg ?55 to 125 c lead solder temperature (10s) (*4) t sol 260 c 2500 v rms isolation voltage (1min., r.h. 60%) bv s (**) 3540 v dc note: using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operat ing temperature/current/voltage, etc. ) are within the absolute maximum ratings. please design the appropriate reliability upon reviewing the toshiba semiconductor reliability handbook (?handling precautions?/?derating concept and methods?) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (*) jedec registered data (**) not registered jedec (*1) 50% duty cycle, 1ms pulse width (*2) pulse width 1 s, 300pps (*3) 6n138 ? 0.5 to 7v (*4) 1.6mm below seating plane
6n138,6n139 2007-10-01 3 electrical characteristics over recommended temperature (ta = 0c to 70c, unless otherwise noted) characteristic symbol test condition min. (*5)typ. max. unit i f =0.5ma, v o =0.4v v cc =4.5v 400 800 ? 6n139 500 900 ? current transfer ratio (note 5, 6) 6n138 ctr(*) i f =1.6ma, v o =0.4v v cc =4.5v 300 600 ? % i f =1.6ma, i o =6.4ma v cc =4.5v ? 0.1 0.4 i f =5ma, i o =15ma v cc =4.5v ? 0.1 0.4 6n139 i f =12ma, i o =24ma v cc =4.5v ? 0.2 0.4 logic low output voltage (note 6) 6n138 v ol i f =1.6ma, i o =4.8ma v cc =4.5v ? 0.1 0.4 v 6n139 i f =0ma, v o =v cc =18v ? 0.05 100 logic high output current (note 6) 6n138 i oh (*) i f =0ma, v o =v cc =7v ? 0.05 250 a logic low supply current (note 6) i ccl i f =1.6ma, v o =open v cc =5v ? 0.2 ? ma logic high supply current (note 6) i cch i f =0ma, v o =open, v cc =5v ? 10 ? na input forward voltage v f (*) i f =1.6ma, ta=25c ? 1.65 1.7 v input reverse breakdown voltage bv r (*) i r =10 a, ta=25c 5 ? ? v temperature coefficient of forward voltage v f / ta i f =1.6ma ? ?1.9 ? mv / c input capacitance c in f=1mhz, v f =0 ? 60 ? pf resistance (input ?output) r i ? o v i ? o =500v (note 7), r.h. 60% ? 10 12 ? ? capacitance (input ?output) c i ? o f=1mhz (note 7) ? 0.6 ? pf (**) jedec registered data. (*5) all typicals at ta=25c and v cc =5v, unless otherwise noted.
6n138,6n139 2007-10-01 4 switching specifications (ta=25c, v cc =5v, unless otherwise specified) characteristic symbol test circuit test condition min. typ. max. unit i f =0.5ma, r l =4.7k ? ? 5 25 6n139 i f =12ma, r l =270 ? ? 0.2 1 propagation delay time to logic low at output (note 6, 8) 6n138 t phl (*) 1 i f =1.6ma, r l =2.2k ? ? 1 10 s i f =0.5ma, r l =4.7k ? ? 5 60 6n139 i f =12ma, r l =270 ? ? 1 7 propagation delay time to logic high at output (note 6, 8) 6n138 t plh (*) 1 i f =1.6ma, r l =2.2k ? ? 4 35 s common mode transient immunity at logic high level output (note 9) cm h 2 i f =0ma, r l =2.2k ? v cm =400v p? p ? 500 ? v / s common mode transient immunity at logic low level output (note 9) cm l 2 i f =1.6ma r l =2.2k ? v cm =400v p? p ? ?500 ? v / s (*)jedec registered data. (note 1): derate linearly above 50c free ? air temperature at a rate of 0.4ma / c (note 2): derate linearly above 50c free ? air temperature at a rate of 0.7mw / c (note 3): derate linearly above 25c free ? air temperature at a rate of 0.7ma / c (note 4): derate linearly above 25c free ? air temperature at a rate of 2.0mw / c (note 5): dc current transfer ratio is defined as the ratio of output collector current, i o , to the forward led input current, i f , times 100%. (note 6): pin 7 open. (note 7): device considered a two ? terminal device: pins 1, 2, 3, and 4 shorted together and pins 5, 6, 7 and 8 shorted together. (note 8): use of a resistor between pin 5 and 7 will decrease gain and delay time. (note 9): common mode transient immunity in logi c high level is the maximum tolerable (positive) dv cm / dt on the leading edge of the common mode pulse, v cm , to assure that the output will remain in a logic high state (i.e., v o > 2.0v). common mode transient immunity in logic low level is the maximum tolerable (negative) dv cm / dt on the trailing edge of the common mode pulse signal, v cm , to assure that the output will remain in a logic low state (i.e., v o < 0.8v).
6n138,6n139 2007-10-01 5 test circuit 1. (*)c l is approximately 15pf which includes probe and stray wiring capacitance. test circuit 2. 4 +5v v o c l (*) r l i f i f 0 v o v ol 1.5v 1.5v 5v t r t phl 100 10% duty cycle 1 / f < 100 s i f monito r f 7 6 5 1 2 3 8 pulse gen. zo = 50 t f = 5ns 5v v o 10% 90% 90% 10% t f (saturated res p onse ) (non- saturated res p onse ) t plh v ol v o swith at b : i f = 1.6ma 5v v o v cm 0v t r, t f = 0.64 s 400v t f 90% 10% t r swith at a : i f = 0ma a v ff i f pulse gen b 4 +5v v o r cc r l 7 6 5 1 2 3 8 + v cm
6n138,6n139 2007-10-01 6 restrictions on product use ? toshiba corporation, and its subsidiaries and affiliates (collect ively ?toshiba?), reserve the right to make changes to the in formation in this document, and related hardware, software a nd systems (collectively ?product?) without notice. ? this document and any information herein may not be reproduc ed without prior written permission from toshiba. even with toshiba?s written permission, reproduc tion is permissible only if reproducti on is without alteration/omission. ? though toshiba works continually to improve product?s quality and reliability, product can malfunction or fail. customers are responsible for complying with safety standards and for prov iding adequate designs and safeguards for their hardware, software and systems which minimize risk and avoid situations in which a ma lfunction or failure of product could cause loss of human life, b odily injury or damage to property, including data loss or corruption. before creating and producing des igns and using, customers mus t also refer to and comply with (a) the latest versions of all re levant toshiba information, including without limitation, this d ocument, the specifications, the data sheets and applic ation notes for product and the precautions and conditions set forth in the ?tosh iba semiconductor reliability handbook? and (b) t he instructions for the application that product will be used with or for. custome rs are solely responsible for all aspects of t heir own product design or applications, incl uding but not limited to (a) determining th e appropriateness of the use of this product in such design or applications; (b) evaluating and det ermining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications. toshiba assumes no liability for customers? product design or applications. ? product is intended for use in general el ectronics applications (e.g., computers, personal equipment, office equipment, measur ing equipment, industrial robots and home electroni cs appliances) or for specif ic applications as expre ssly stated in this document . product is neither intended nor warranted for use in equipment or systems that require extraordinarily high levels of quality a nd/or reliability and/or a malfunction or failure of which may cause loss of human life, bodily injury, serious property damage or se rious public impact (?unintended use?). unintended use includes, without limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic s ignaling equipment, equipment used to control combustions or explosions, safety dev ices, elevators and escalato rs, devices related to el ectric power, and equipment used in finance-related fields. do not use product for unintended use unless specifically permitted in thi s document. ? do not disassemble, analyze, reverse-engineer, alter, modify, translate or copy product, whether in whole or in part. ? product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable laws or regulations. ? the information contained herein is pres ented only as guidance for product use. no re sponsibility is assumed by toshiba for an y infringement of patents or any other intellectual property rights of third parties that may result from the use of product. no license to any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise. ? a bsent a written signed agreement, except as provid ed in the relevant terms and conditions of sale for product, and to the maximum extent allowable by law, toshiba (1) assumes no liability whatsoever, including without limitation, indirect, co nsequential, special, or incidental damages or loss, including without limitation, loss of profit s, loss of opportunities, business interruption and loss of data, and (2) disclaims any and all express or implied warranties and conditions related to sale, use of product, or information, including warranties or conditions of merchantability, fitness for a particular purpose, accuracy of information, or noninfringement. ? gaas (gallium arsenide) is used in product. gaas is harmful to humans if consumed or absorbed, whether in the form of dust or vapor. handle with care and do not break, cut, crush, grind, dissolve chemically or otherwise expose gaas in product. ? do not use or otherwise make available product or related so ftware or technology for any military purposes, including without limitation, for the design, development, use, stockpiling or m anufacturing of nuclear, chemical , or biological weapons or missi le technology products (mass destruction w eapons). product and related software and technology may be controlled under the japanese foreign exchange and foreign trade law and the u.s. expor t administration regulations. ex port and re-export of product or related software or technology are strictly prohibited exc ept in compliance with all applicable export laws and regulations. ? please contact your toshiba sales representative for details as to environmental matters such as the rohs compatibility of pro duct. please use product in compliance with all applicable laws and regula tions that regulate the inclusion or use of controlled subs tances, including without limitation, the eu rohs directive. toshiba assumes no liability for damages or losses occurring as a result o f noncompliance with applicable laws and regulations.
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